SHOT NOISE BEHAVIOR OF SUB-THRESHOLD MOS-TRANSISTORS

被引：13
|
作者：
FELLRATH, J
机构：
来源：
REVUE DE PHYSIQUE APPLIQUEE | 1978年 / 13卷 / 12期
关键词：
D O I：
10.1051/rphysap:019780013012071900
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：719 / 723
页数：5
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