SPECTRAL INTERFERENCES IN SECONDARY ION MASS-SPECTROMETRY

被引：21
|
作者：
COLBY, BN [1 ]
EVANS, CA [1 ]
机构：
[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
来源：
APPLIED SPECTROSCOPY | 1973年 / 27卷 / 04期
关键词：
D O I：
10.1366/000370273774333515
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：274 / 279
页数：6
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