SPECTRAL INTERFERENCES IN SECONDARY ION MASS-SPECTROMETRY

被引：21

作者：

COLBY, BN ^{[1
]}

EVANS, CA ^{[1
]}

机构：

[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801

来源：

APPLIED SPECTROSCOPY | 1973年 / 27卷 / 04期

关键词：

D O I：

10.1366/000370273774333515

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：274 / 279

页数：6

共 50 条

[21] SECONDARY ION MASS-SPECTROMETRY OF POLYMERS
CAMPANA, JE
ROSE, SL
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 483 - 486
[22] SECONDARY-ION MASS-SPECTROMETRY
ZALM, PC
VACUUM, 1994, 45 (6-7) : 753 - 772
[23] MOLECULAR SECONDARY ION MASS-SPECTROMETRY
PACHUTA, SJ
COOKS, RG
ACS SYMPOSIUM SERIES, 1985, 291 : 1 - 42
[24] A NOVEL ION IMAGER FOR SECONDARY ION MASS-SPECTROMETRY
MATSUMOTO, K
YURIMOTO, H
KOSAKA, K
MIYATA, K
NAKAMURA, T
SUENO, S
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (01) : 82 - 85
[25] A MECHANISM OF ION PRODUCTION IN SECONDARY ION MASS-SPECTROMETRY
KIDWELL, DA
ROSS, MM
COLTON, RJ
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1987, 78 : 315 - 328
[26] Systems for the suppression of spectral interferences for inductively coupled plasma mass-spectrometry
A. Yu. Leykin
P. V. Yakimovich
Journal of Analytical Chemistry, 2012, 67 : 677 - 686
[27] Systems for the suppression of spectral interferences for inductively coupled plasma mass-spectrometry
Leykin, A. Yu.
Yakimovich, P. V.
JOURNAL OF ANALYTICAL CHEMISTRY, 2012, 67 (08) : 677 - 686
[28] SECONDARY ION MASS-SPECTROMETRY - A MULTIDIMENSIONAL TECHNIQUE
COLTON, RJ
KIDWELL, DA
RAMSEYER, GO
ROSS, MM
ACS SYMPOSIUM SERIES, 1985, 291 : 160 - 193
[29] SECONDARY-ION MASS-SPECTROMETRY AND GEOLOGY
MACRAE, ND
CANADIAN MINERALOGIST, 1995, 33 : 219 - 236
[30] SECONDARY ION MASS-SPECTROMETRY OF DISPIROTRIPIPERAZINIUM COMPOUNDS
ANISIMOVA, OS
SHEINKER, YN
ORDZHONIKIDZE, S
PLESHKOVA, AP
ORGANIC MASS SPECTROMETRY, 1990, 25 (08): : 432 - 434

← 1 2 3 4 5 →