X-RAY PHOTOELECTRON-SPECTROSCOPY CHARACTERIZATION OF AMORPHOUS MOLYBDENUM OXYSULFIDE THIN-FILMS

被引：140

作者：

BENOIST, L ^{[1
]}

GONBEAU, D ^{[1
]}

PFISTERGUILLOUZO, G ^{[1
]}

SCHMIDT, E ^{[1
]}

MEUNIER, G ^{[1
]}

LEVASSEUR, A ^{[1
]}

机构：

[1] UNIV BORDEAUX 1,ECOLE NATL SUPER CHIM & PHYS BORDEAUX,CNRS,CHIM SOLIDE LAB,F-33405 TALENCE,FRANCE

来源：

THIN SOLID FILMS | 1995年 / 258卷 / 1-2期

关键词：

AMORPHOUS MATERIALS; MOLYBDENUM; SURFACE STRUCTURE; X-RAY PHOTOELECTRON SPECTROSCOPY;

D O I：

10.1016/0040-6090(94)06383-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this study, new amorphous molybdenum oxysulfide thin films, prepared by r.f. magnetron sputtering and which could be used as positive electrode materials in microbatteries, were analyzed by X-ray photoelectron spectroscopy. In light of the binding energies obtained for reference compounds (different molybdenum oxides and sulfides), the results have shown the existence of several environments of molybdenum atoms. In addition to environments such as in MoO3 and MoS2, a new one has been identified; the closest neighbors of this molybdenum appear to be isolated ''S2-'', disulfide ''(S-2)(2-)'' ions, and ''O2-'' ions with the sulfur ions present in the same proportions as the oxygen ions.

引用

页码：110 / 114

页数：5

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