DIMENSIONAL CROSSOVER SCALING IN THE LAYERED XY-MODEL AND HE-4 FILMS

被引:8
|
作者
SCHNEIDER, T
SCHMIDT, A
机构
[1] IBM Research Division, Zurich Research Laboratory
关键词
D O I
10.1143/JPSJ.61.2169
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using finite size scaling we relate the fall of the transition temperature with reduced thickness to the temperature dependence of the bulk superfluid density and the amplitude of the perpendicular phase correlation length. The scaling predictions agree quantitatively with Monte Carlo estimates of the xv-model and experiments on He-4 films. We also investigate the behavior of the helicity modulus for different system thickness, showing the crossover from the universal Kosterlitz-Thouless jump to the three-dimensional behavior.
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页码:2169 / 2172
页数:4
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