EXPERIMENTAL CONDITIONS FOR SURFACE MICROANALYSIS WITH REFLECTION ELECTRON ENERGY-LOSS SPECTROSCOPY

被引:6
作者
WANG, ZL [1 ]
机构
[1] SUNY STONY BROOK,DEPT MAT SCI & ENGN,STONY BROOK,NY 11794
来源
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 11卷 / 01期
关键词
D O I
10.1002/jemt.1060110109
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:70 / 75
页数:6
相关论文
共 13 条
[1]   ELECTRON-ENERGY LOSS SPECTRA AND REFLECTION IMAGES FROM SURFACES [J].
HOWIE, A ;
MILNE, RH .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :279-285
[2]   CONVERGENT-BEAM REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OBSERVATIONS FROM AN SI(111) SURFACE [J].
LEHMPFUHL, G ;
DOWELL, WCT .
ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :569-577
[3]   FAST-ELECTRON SPECTROSCOPY OF SURFACE EXCITATIONS [J].
LUCAS, AA ;
SUNJIC, M .
PHYSICAL REVIEW LETTERS, 1971, 26 (05) :229-&
[4]   RESONANCE EFFECTS IN RHEED FROM PT(111) [J].
MARTEN, H ;
MEYEREHMSEN, G .
SURFACE SCIENCE, 1985, 151 (2-3) :570-584
[5]  
MIYAKE S, 1970, ACTA CRYSTALLOGR A, V26, P20
[6]   GEOMETRIC ANALYSIS OF SURFACE RESONANCE CONDITIONS IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION [J].
PENG, LM ;
COWLEY, JM .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 6 (01) :43-53
[7]   ZONE-AXIS PATTERNS IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION - A FAMILY OF NEW TECHNIQUES FOR SURFACE CHARACTERIZATION [J].
SHANNON, MD ;
EADES, JA ;
MEICHLE, ME ;
TURNER, PS .
ULTRAMICROSCOPY, 1985, 16 (02) :175-192
[8]   ELECTRON RESONANCE CHANNELING ON CRYSTAL-SURFACES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION GEOMETRY [J].
WANG, ZL ;
LU, P ;
COWLEY, JM .
ULTRAMICROSCOPY, 1987, 23 (02) :205-221
[9]   REFLECTION ELECTRON-ENERGY LOSS SPECTROSCOPY (REELS) - A TECHNIQUE FOR THE STUDY OF SURFACES [J].
WANG, ZL ;
COWLEY, JM .
SURFACE SCIENCE, 1988, 193 (03) :501-512
[10]  
WANG ZL, 1988, J MICROSC SPECT ELEC, V13, P189