THE PROFILE OF LAYERED MATERIALS REFLECTED BY GLANCING-INCIDENCE X-RAY-ANALYSIS

被引：0
|
作者：
DEBOER, DKG [1 ]
LEENAERS, AJG [1 ]
VANDENHOOGENHOF, WW [1 ]
机构：
[1] PHILIPS ANALYT X-RAY BV,7602 EA ALMELO,NETHERLANDS
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1994年 / 58卷 / 03期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Specular reflectivity, diffuse scattering at glancing incidence and angle-dependent total-reflection X-ray fluorescence are complementary techniques for the investigation of layered materials. The principles of these glancing-incidence X-ray methods are briefly discussed. Examples show the strength of the combination of these techniques.
引用
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页码：169 / 172
页数：4
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