RESISTANCE OSCILLATIONS AND CROSSOVER IN ULTRATHIN GOLD-FILMS

被引：79

作者：

JALOCHOWSKI, M ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,D-3392 CLAUSTHAL ZELLERFE,FED REP GER

来源：

PHYSICAL REVIEW B | 1988年 / 37卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.37.8622

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8622 / 8626

页数：5

共 27 条

[1] DIMENSIONALITY AND SIZE EFFECTS IN SIMPLE METALS [J].

BATRA, IP ;

CIRACI, S ;

SRIVASTAVA, GP ;

NELSON, JS ;

FONG, CY .

PHYSICAL REVIEW B, 1986, 34 (12) :8246-8257

[2] STRUCTURE AND GROWTH OF CRYSTALLINE SUPERLATTICES - FROM MONOLAYER TO SUPERLATTICE [J].

BAUER, E ;

VANDERMERWE, JH .

PHYSICAL REVIEW B, 1986, 33 (06) :3657-3671

[3] WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].

BERGMANN, G .

PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58

[4] LOCALIZATION AND SIZE EFFECTS IN SINGLE-CRYSTAL AU FILMS [J].

CHAUDHARI, P ;

HABERMEIER, HU ;

MAEKAWA, S .

PHYSICAL REVIEW LETTERS, 1985, 55 (04) :430-432

[5] LOCALIZATION AND SIZE EFFECTS IN SINGLE-CRYSTAL AU FILMS - REPLY [J].

CHAUDHARI, P ;

HABERMEIER, HU ;

MAEKAWA, S .

PHYSICAL REVIEW LETTERS, 1986, 57 (14) :1814-1814

[6] DETERMINATION OF THE SURFACE CONDUCTIVITY OF ULTRATHIN METALLIC-FILMS ON SI(111) BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY [J].

DEMUTH, JE ;

PERSSON, BNJ .

PHYSICAL REVIEW LETTERS, 1985, 54 (06) :584-587

[7] MEAN FREE-PATH AND DENSITY OF CONDUCTANCE ELECTRONS IN PLATINUM DETERMINED BY THE SIZE EFFECT IN EXTREMELY THIN-FILMS [J].

FISCHER, G ;

HOFFMANN, H ;

VANCEA, J .

PHYSICAL REVIEW B, 1980, 22 (12) :6065-6073

[8] IOFFE-REGEL CRITERION AND RESISTIVITY OF METALS [J].

GURVITCH, M .

PHYSICAL REVIEW B, 1981, 24 (12) :7404-7407

[9]

HARRIS JJ, 1981, SURF SCI, V103, pL90, DOI 10.1016/0039-6028(81)90091-1

[10]

HARRIS JJ, 1981, SURF SCI, V108, pL444, DOI 10.1016/0039-6028(81)90440-4

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