RESISTANCE OSCILLATIONS AND CROSSOVER IN ULTRATHIN GOLD-FILMS

被引：79

作者：

JALOCHOWSKI, M ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,D-3392 CLAUSTHAL ZELLERFE,FED REP GER

来源：

PHYSICAL REVIEW B | 1988年 / 37卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.37.8622

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8622 / 8626

页数：5

共 27 条

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[5] LOCALIZATION AND SIZE EFFECTS IN SINGLE-CRYSTAL AU FILMS - REPLY
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[6] DETERMINATION OF THE SURFACE CONDUCTIVITY OF ULTRATHIN METALLIC-FILMS ON SI(111) BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
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[J]. PHYSICAL REVIEW LETTERS, 1985, 54 (06) : 584 - 587
[7] MEAN FREE-PATH AND DENSITY OF CONDUCTANCE ELECTRONS IN PLATINUM DETERMINED BY THE SIZE EFFECT IN EXTREMELY THIN-FILMS
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[9] HARRIS JJ, 1981, SURF SCI, V103, pL90, DOI 10.1016/0039-6028(81)90091-1
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