OBSERVATION OF SI AND SIC SURFACE-STRUCTURES USING THE MAGNETIC LEED METHOD

被引：0

作者：

NISHIMORI, K

TOKUTAKA, H

OKINAGA, Z

KISHIDA, S

ISHIHARA, N

机构：

[1] Department of Electronics, Faculty of Engineering, Tottori University, Tottori, 680, Koyama

来源：

APPLIED SURFACE SCIENCE | 1989年 / 41-2卷

关键词：

D O I：

10.1016/0169-4332(89)90031-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have developed a magnetic LEED (MLEED) system of the so called Tucker's type. The improvement of spot intensities at very low electron energy was made with the micro-channel plate (MCP) as an image intensifier. Using this MLEED apparatus, we have clearly observed Si(111) 7×7 and SiC(0001)1×1 patterns without shadow of the specimen, particularly at normal incidence. © 1989.

引用

页码：49 / 52

页数：4