共 21 条
[1]
DEPTH SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS BY MEANS OF SCATTERED ELECTRONS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 115 (02)
:373-380
[2]
SIMPLE METHOD FOR ANALYSIS OF DEPTH-SELECTIVE MOSSBAUER-EFFECT MEASUREMENTS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 118 (01)
:313-316
[3]
DEPTH SELECTION BY MEANS OF SCATTERED ELECTRONS - METHOD TO DETERMINE ELECTRON LINE PROFILES
[J].
NUCLEAR INSTRUMENTS & METHODS,
1973, 108 (03)
:439-443
[4]
BENNETT LH, 1972, INT C APPLICATIONS M
[5]
METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT
[J].
NUCLEAR INSTRUMENTS & METHODS,
1969, 70 (01)
:36-&
[7]
CARBUCICCHIO M, IN PRESS
[9]
MOSSBAUER SCATTERING WITH EFFICIENT GEOMETRY
[J].
NUCLEAR INSTRUMENTS & METHODS,
1967, 53 (02)
:273-+
[10]
NEW DETECTOR ASSEMBLY FOR CONVERSION ELECTRONS AND X-RAYS FROM MOSSBAUER-EFFECT
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 120 (01)
:23-28