DEVELOPMENT OF SEMICONDUCTOR STORAGE DEVICE DEPENDS ON MOS DRAIN CAPACITOR

被引:0
|
作者
不详
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:81 / &
相关论文
共 50 条
  • [41] Retrospective Exposure Assessment for Semiconductor and Storage Device Manufacturing Facilities
    Rodrigues, Ema G.
    Stewart, James
    Herrick, Robert
    Palacios, Helena
    Laden, Francine
    Clark, William
    Delzell, Elizabeth
    JOURNAL OF OCCUPATIONAL AND ENVIRONMENTAL MEDICINE, 2019, 61 (04) : E132 - E138
  • [42] Mortality among semiconductor and storage device-manufacturing workers
    Beall, C
    Bender, TJ
    Cheng, H
    Herrick, R
    Kahn, A
    Matthews, R
    Sathiakumar, N
    Schymura, M
    Stewart, J
    Delzell, E
    JOURNAL OF OCCUPATIONAL AND ENVIRONMENTAL MEDICINE, 2005, 47 (10) : 996 - 1014
  • [43] Cancer incidence among semiconductor and electronic storage device workers
    Bender, T. J.
    Beall, C.
    Cheng, H.
    Herrick, R. F.
    Kahn, A. R.
    Matthews, R.
    Sathiakumar, N.
    Schymura, M. J.
    Stewart, J. H.
    Delzell, E.
    OCCUPATIONAL AND ENVIRONMENTAL MEDICINE, 2007, 64 (01) : 30 - 36
  • [44] Development of portable solar storage device
    Roslan, M. S.
    Adan, F.
    Mohammad, M. A.
    Norazman, N.
    Haizam, S.
    Haider, Z.
    PHOTONICS MEETING 2019, THE 2ND ANNUAL CONFERENCE AND WORKSHOP, 2019, 1371
  • [46] APPLICATIONS OF A SEMICONDUCTOR-SURFACE-STATE CHARGE-STORAGE DEVICE
    SWARTZENDRUBER, LJ
    SOLID-STATE ELECTRONICS, 1963, 6 (01) : 59 - &
  • [47] Device and Process Simulations for Semiconductor Technology Development.
    Runovc, Franc
    Elektrotehniski Vestnik/Electrotechnical Review, 1986, 53 (4-5): : 197 - 203
  • [48] Nanoimprint Lithography Materials Development for Semiconductor Device Fabrication
    Costner, Elizabeth A.
    Lin, Michael W.
    Jen, Wei-Lun
    Willson, C. Grant
    ANNUAL REVIEW OF MATERIALS RESEARCH, 2009, 39 : 155 - 180
  • [49] A semiconductor valid device development and production control methodology
    Leibiger, S
    ASCMC 2003: IEEE/SEMI (R) ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP, PROCEEDINGS, 2003, : 280 - 285
  • [50] Device Electrostatics and High Temperature Operation of Oxygen Terminated Boron Doped Diamond MOS Capacitor and MOSFET
    Pullaiah, Yerragudi
    Emani, Naresh Kumar
    Nayak, Kaushik
    2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), 2020,