A Statistical Study on Wave Scattering on Rough Surfaces Using Ultrasonic Numerical Simulations

被引:1
作者
Choi, Wonjae [1 ]
Kim, Kibok [1 ]
Kwon, Segon [1 ]
机构
[1] Korea Res Inst Stand & Sci, Ctr Safety Measurement, Daejeon 34113, South Korea
关键词
Rough Surface; Statistical study; Ultrasonic Testing; Wave Scattering; Numerical Simulation;
D O I
10.7779/JKSNT.2018.38.3.197
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Ultrasonic inspection is a non-destructive evaluation method widely used in various industrial fields for its advantages including deep penetration and safety. The existence or size of a defect is estimated by using the ultrasonic waves reflected from the object to be inspected; defects initiated from natural failure have rougher surfaces. The characteristics of the reflected waves are related to the roughness of the defects. If the surface is significantly rough, ultrasonic scattering occurs and the reflected signal has a low amplitude, but when the surface is less rough, a high response signal can be obtained. In ultrasonic scattering, roughness relative to the input wavelength is more important than its absolute value. Predicting the scattering behavior can be a useful basis for improving the defect detection rate by developing an inspection method based on the scattering information. The roughness of the surface is generally expressed in a statistical manner so that reflections on rough surfaces can be described the same way. A large number of samples are required to obtain statistically meaningful results, but because there are limitations in obtaining such a number of experimental results, it is often the case that statistical results are derived based on virtual experiments. In this paper, we introduce a statistical analysis method of ultrasonic scattering on a rough surface for a virtual experiment of rough surface scattering, and compare the results based on the Kirchhoff Approximation and finite element analysis for normal incidence with vertical reflection of the plane wave.
引用
收藏
页码:197 / 202
页数:6
相关论文
共 50 条
[1]   Rough surface reconstruction of real surfaces for numerical simulations of ultrasonic wave scattering [J].
Choi, Wonjae ;
Shi, Fan ;
Lowe, Michael J. S. ;
Skelton, Elizabeth A. ;
Craster, Richard V. ;
Daniels, William L. .
NDT & E INTERNATIONAL, 2018, 98 :27-36
[2]   Numerical Study on Ultrasonic Wave Scattering of Rough Finite-Size Cracks [J].
Choi, Wonjae .
JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING, 2020, 40 (05) :346-352
[3]   Elastic wave scattering from rough free surfaces [J].
Dai, SW ;
Zhang, HL .
PROGRESS IN NATURAL SCIENCE, 2001, 11 :S110-S113
[4]   Random Gaussian Rough Surfaces for Full-Wave Electromagnetic Simulations [J].
Mrnka, Michal .
2017 CONFERENCE ON MICROWAVE TECHNIQUES (COMITE), 2017,
[5]   Numerical simulations of ultrasonic array imaging of highly scattering materials [J].
Van Pamel, Anton ;
Huthwaite, Peter ;
Brett, Colin R. ;
Lowe, Michael J. S. .
NDT & E INTERNATIONAL, 2016, 81 :9-19
[6]   Characterization of rough self-affine surfaces by electromagnetic wave scattering [J].
Simonsen, I ;
Tarrats, A ;
Vandembroucq, D .
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2002, 4 (05) :S168-S174
[7]   Electromagnetic Scattering Study of Complex Targets on Rough Surfaces [J].
Zhang, Yu-rong ;
He, Si-yuan ;
Zhu, Guo-qiang ;
Li, Xin ;
Li, Ye .
2019 INTERNATIONAL APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY SYMPOSIUM - CHINA (ACES), VOL 1, 2019,
[8]   Numerical study on characteristics of particle depositon with rough surfaces [J].
Hong W. ;
Qi Q. .
Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering, 2016, 36 :147-153
[9]   A study of elastic-plastic contact of statistical rough surfaces [J].
Peng, He ;
Liu, Zhansheng ;
Huang, Feilin ;
Ma, Ruixian .
PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART J-JOURNAL OF ENGINEERING TRIBOLOGY, 2013, 227 (10) :1076-1089
[10]   Modeling and evaluation of millimeter wave scattering from minimally rough surfaces on stones [J].
Yoshino, Riku ;
Kanaya, Tomohiko ;
Takada, Shintaro ;
Jitsuno, Kunihisa ;
Inagaki, Keizo ;
Kawanishi, Tetsuya .
IEICE ELECTRONICS EXPRESS, 2022, 19 (13)