XPS AND SIMS CHARACTERIZATION OF METAL-OXIDE AMORPHOUS-SILICON CARBON INTERFACES

被引：12

作者：

EICKE, A

BILGER, G

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 12卷 / 1-12期

关键词：

D O I：

10.1002/sia.740120605

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：344 / 350

页数：7

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