XPS AND SIMS CHARACTERIZATION OF METAL-OXIDE AMORPHOUS-SILICON CARBON INTERFACES

被引：12
作者：
EICKE, A
BILGER, G
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1988年 / 12卷 / 1-12期
关键词：
D O I：
10.1002/sia.740120605
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：344 / 350
页数：7
相关论文
共 26 条
  • [1] EVIDENCE FOR A SOLID-STATE REACTION AT THE A-SI-SNOX INTERFACE - AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY
    BADRINARAYANAN, S
    SINHA, S
    SINHA, APB
    [J]. THIN SOLID FILMS, 1986, 144 (01) : 133 - 137
  • [2] STRUCTURAL-PROPERTIES OF A-SIC-H-ALLOYS AND A-SIN-H-ALLOYS FROM XPS-ANALYSES AND IR-ABSORPTION
    BAUER, GH
    MOHRING, HD
    BILGER, G
    EICKE, A
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 : 873 - 876
  • [3] BERRESHEIM A, 1983, EMPIRICAL ATOMIC SEN
  • [4] BETZ G, 1983, TOPICS APPL PHYS, V52, P78
  • [5] HYDROGEN EVOLUTION FROM A-SI-C-H AND A-SI-GE-H ALLOYS
    BEYER, W
    WAGNER, H
    FINGER, F
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 : 857 - 860
  • [6] BILGER G, 1987, 19TH P IEEE PHOT SPE, P615
  • [7] ESER F, 1987, 7TH P EC PHOT SOL EN, P560
  • [8] DIFFUSION OF INDIUM AND TIN INTO A-SIO-H FROM TRANSPARENT ELECTRODE STUDIED BY XPS
    FUKADA, N
    FUKUSHIMA, Y
    IMURA, T
    HIRAKI, A
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1983, 59-6 (DEC) : 525 - 528
  • [9] Hofmann S., 1980, Surface and Interface Analysis, V2, P148, DOI 10.1002/sia.740020406
  • [10] COMPUTER-SIMULATION OF KNOCK-ON EFFECT UNDER ION-BOMBARDMENT
    ISHITANI, T
    SHIMIZU, R
    [J]. PHYSICS LETTERS A, 1974, A 46 (07) : 487 - 488
123