HIGH-RESOLUTION ELECTRON-MICROSCOPY OF INAS/GAAS STRAINED-LAYER SUPERLATTICES

被引：18
|
作者：
DANTERROCHES, C [1 ]
MARZIN, JY [1 ]
LEROUX, G [1 ]
GOLDSTEIN, L [1 ]
机构：
[1] CTR NATL ETUD TELECOMMUN,F-92131 ISSY MOULINEAUX,FRANCE
来源：
JOURNAL OF CRYSTAL GROWTH | 1987年 / 81卷 / 1-4期
关键词：
D O I：
10.1016/0022-0248(87)90378-2
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
19
引用
收藏
页码：121 / 129
页数：9
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