LASER-EXAFS - FAST EXTENDED X-RAY ABSORPTION FINE-STRUCTURE SPECTROSCOPY WITH A SINGLE PULSE OF LASER-PRODUCED X-RAYS

被引：32
作者：
MALLOZZI, PJ
SCHWERZEL, RE
EPSTEIN, HM
CAMPBELL, BE
机构：
[1] Battelle, Columbus Laboratories, Columbus
来源：
SCIENCE | 1979年 / 206卷 / 4416期
关键词：
D O I：
10.1126/science.206.4416.353
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
The extended x-ray absorption fine structure (EXAFS) spectrum of aluminum has been measured with a nanosecond pulse of soft x-rays generated by a laser-produced plasma. This technique provides a practical alternative to synchrotron radiation for the acquisition of EXAFS data. It also provides a unique capability for the analysis of molecular structure in highly transient chemical species. Copyright © 1979 AAAS.
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页码：353 / 355
页数：3
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