WHITE-LIGHT DIFFRACTION PATTERNS OF AMPLITUDE AND PHASE ZONE PLATES

被引:7
作者
HIGNETTE, O
SANTAMARIA, J
BESCOS, J
机构
[1] Instituto de Optica, Serrano
来源
JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 1979年 / 10卷 / 05期
关键词
D O I
10.1088/0150-536X/10/5/002
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The polychromatic properties of the Fresnel zone plate, Gabor zone plate, phase reversal zone plates and kinoform lens are studied. The polychromatic intensity in the diffraction patterns on these plates has been computed and the influence of Gaussian spectral filters is shown. Also, the distributions of illuminance and chromaticity in the diffraction patterns and along the optical axis, have been calculated for several zone numbers. The results obtained are discussed and compared for the different plates.
引用
收藏
页码:231 / 238
页数:8
相关论文
共 12 条
[1]   FRESNEL ZONE PLATE IMAGING OF GAMMA-RAYS - THEORY [J].
BARRETT, HH ;
HORRIGAN, FA .
APPLIED OPTICS, 1973, 12 (11) :2686-2702
[2]  
BOIVIN A, 1964, THEORIE CALCUL FIGUR
[3]  
BORN M, 1970, PRINCIPLE OPTICS
[4]   COMPUTER-DRAWN MODULATED ZONE PLATES [J].
ENGEL, A ;
HERZIGER, G .
APPLIED OPTICS, 1973, 12 (03) :471-479
[5]   SPECTRAL RESOLUTION OF A ZONEPLATE WITH CIRCULAR SENSOR [J].
FEDOTOWSKY, A ;
LEHOVEC, K .
APPLIED OPTICS, 1977, 16 (03) :582-586
[6]   PHASE ZONE PLATES FOR X-RAYS AND EXTREME UV [J].
KIRZ, J .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (03) :301-309
[7]   WHITE-LIGHT OPTICAL PROCESSING AND HOLOGRAPHY [J].
LEITH, E ;
ROTH, J .
APPLIED OPTICS, 1977, 16 (09) :2565-2567
[8]   KINOFORM - A NEW WAVEFRONT RECONSTRUCTION DEVICE [J].
LESEM, LB ;
HIRSCH, PM ;
JORDAN, JA .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1969, 13 (02) :150-&
[9]   SOFT-X-RAY IMAGING ZONE PLATES WITH LARGE ZONE NUMBERS FOR MICROSCOPIC AND SPECTROSCOPIC APPLICATIONS [J].
NIEMANN, B ;
RUDOLPH, D ;
SCHMAHL, G .
OPTICS COMMUNICATIONS, 1974, 12 (02) :160-163
[10]   OPTICAL IMAGE FORMATION WITH A FRESNEL ZONE PLATE USING VACUUM ULTRAVIOLET RADIATION [J].
PFEIFER, CD ;
FERRIS, LD ;
YEN, WM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (01) :91-95