BEAM-SCANNING SYSTEM FOR DETERMINATION OF BEAM PROFILES AND FORM-FACTORS IN MERGED-BEAM EXPERIMENTS

被引：27

作者：

KEYSER, CJ ^{[1
]}

FROELICH, HR ^{[1
]}

MITCHELL, JBA ^{[1
]}

MCGOWAN, JW ^{[1
]}

机构：

[1] UNIV WESTERN ONTARIO,CTR CHEM PHYS,LONDON N6A 3K7,ONTARIO,CANADA

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1979年 / 12卷 / 04期

关键词：

D O I：

10.1088/0022-3735/12/4/022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A beam-scanning system for a merged electron-ion beam experiment is described. This system is used to determined the horizontal and vertical beam profiles and the form factors at three different locations along the axis of the beams. Design details of the wedge-shaped scanners and the electronic circuit for obtaining beam profiles and form factors are described. The form factor derivation for merged beams is given and an expression in terms of measured quantities is derived.

引用

页码：316 / 320

页数：5

共 9 条

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