PSEUDORANDOM TEST-GENERATION FOR COMPLEX LOGIC-CIRCUITS

被引：0
作者：
SHTREJMIKIS, AZ
TARGAMADZE, AE
机构：
来源：
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA | 1992年 / 03期
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：69 / 76
页数：8
相关论文
共 50 条
  • [21] ECL LOGIC-CIRCUITS
    BYERS, TJ
    [J]. RADIO-ELECTRONICS, 1983, 54 (09): : 53 - 56
  • [22] A TEST-GENERATION PROGRAM FOR SEQUENTIAL-CIRCUITS
    MACII, E
    MEO, AR
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1994, 5 (01): : 115 - 119
  • [23] AUTOMATED TEST-GENERATION FOR INTEGRATED-CIRCUITS
    MARLETT, R
    [J]. VLSI SYSTEMS DESIGN, 1986, 7 (07): : 68 - &
  • [24] LOGIC DESIGN VERIFICATION VIA TEST-GENERATION
    ABADIR, MS
    FERGUSON, J
    KIRKLAND, TE
    [J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1988, 7 (01) : 138 - 148
  • [25] DIGITAL LOGIC-CIRCUITS
    HASUO, S
    IMAMURA, T
    [J]. PROCEEDINGS OF THE IEEE, 1989, 77 (08) : 1177 - 1193
  • [26] 2 TEST-GENERATION METHODS FOR SEQUENTIAL-CIRCUITS
    HAYASHI, T
    HATAYAMA, K
    ISHIYAMA, S
    TAKAKURA, M
    [J]. 1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3, 1989, : 1942 - 1945
  • [27] AUTOMATIC TEST-GENERATION FOR DIGITAL ELECTRONIC-CIRCUITS
    CHAKRABORTY, TJ
    DAVIDSON, S
    MAAMARI, F
    CHENG, KT
    [J]. AT&T TECHNICAL JOURNAL, 1994, 73 (02): : 19 - 29
  • [28] IMPROVED TEST-GENERATION FOR HIGH-ACTIVITY CIRCUITS
    SALUJA, K
    KIM, K
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 1990, 7 (04): : 26 - 31
  • [29] TEST-GENERATION FOR PRESETTABLE SYNCHRONOUS SEQUENTIAL-CIRCUITS
    WANG, JF
    KUO, TY
    CHEN, PC
    LEE, JY
    [J]. 1989 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS: PROCEEDINGS OF TECHNICAL PAPERS, 1989, : 155 - 158
  • [30] AN ALGEBRAIC TEST-GENERATION PROCEDURE FOR SEQUENTIAL-CIRCUITS
    MEO, AR
    MEZZALAMA, M
    PRINETTO, P
    [J]. ALTA FREQUENZA, 1984, 53 (03): : 126 - 142
12345