PSEUDORANDOM TEST-GENERATION FOR COMPLEX LOGIC-CIRCUITS

被引：0

|

作者：

SHTREJMIKIS, AZ

TARGAMADZE, AE

机构：

来源：

AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA | 1992年 / 03期

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

引用

收藏

页码：69 / 76

页数：8

相关论文

共 50 条

[11] TEST-GENERATION FOR SEQUENTIAL-CIRCUITS
MA, HKT
DEVADAS, S
NEWTON, AR
SANGIOVANNIVINCENTELLI, A
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1988, 7 (10) : 1081 - 1093
[12] 3-WEIGHT PSEUDORANDOM TEST-GENERATION BASED ON A DETERMINISTIC TEST SET FOR COMBINATIONAL AND SEQUENTIAL-CIRCUITS
POMERANZ, I
REDDY, SM
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1993, 12 (07) : 1050 - 1058
[13] TEST-GENERATION THROUGH LOGIC PROGRAMMING
SVANAES, D
AAS, EJ
INTEGRATION-THE VLSI JOURNAL, 1984, 2 (01) : 49 - 67
[14] ONE ALGORITHM OF PSEUDORANDOM TEST-GENERATION FOR LARGE COMBINATIONAL DEVICES
ANDRJUKHIN, AI
SPERANSKIJ, DV
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1989, (03): : 94 - 95
[15] TEST-GENERATION FOR HIGHLY SEQUENTIAL-CIRCUITS
GHOSH, A
DEVADAS, S
NEWTON, AR
1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, : 362 - 365
[16] FAST TEST-GENERATION FOR SEQUENTIAL-CIRCUITS
KELSEY, TP
SALUJA, KK
1989 IEEE INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN: DIGEST OF TECHNICAL PAPERS, 1989, : 354 - 357
[17] TEST-GENERATION FOR CYCLIC COMBINATIONAL-CIRCUITS
RAHUNATHAN, A
ASHAR, P
MALIK, S
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1995, 14 (11) : 1408 - 1414
[18] MODELING AND TEST-GENERATION ALGORITHMS FOR MOS CIRCUITS
JAIN, SK
AGRAWAL, VD
IEEE TRANSACTIONS ON COMPUTERS, 1985, 34 (05) : 426 - 433
[19] ON ONE CLASS OF EASY-TO-TEST LOGIC-CIRCUITS
STUKACH, ND
AVTOMATIKA I VYCHISLITELNAYA TEKHNIKA, 1990, (05): : 77 - 84
[20] AUTOMATIC TEST-GENERATION TACKLES SEQUENTIAL LOGIC
GOERING, R
COMPUTER DESIGN, 1986, 25 (03): : 24 - 26

← 1 2 3 4 5 →