XPS STOICHIOMETRY MEASUREMENTS ON SURFACES OF III-V CRYSTALLINE COMPOUNDS

被引：31
作者：
ALNOT, P [1 ]
OLIVIER, J [1 ]
FADLEY, CS [1 ]
机构：
[1] UNIV HAWAII MANOA,DEPT CHEM,HONOLULU,HI 96822
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1989年 / 49卷 / 02期
关键词：
D O I：
10.1016/0368-2048(89)85005-4
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：159 / 173
页数：15
相关论文
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