OPTICAL CHARACTERIZATION AND BAND OFFSETS IN ZNSE-ZNSXSE1-X STRAINED-LAYER SUPERLATTICES

被引：188

作者：

SHAHZAD, K ^{[1
]}

OLEGO, DJ ^{[1
]}

VAN DE WALLE, CG ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.38.1417

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1417 / 1426

页数：10

共 29 条

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