RELIABLE TIP PREPARATION FOR HIGH-RESOLUTION SCANNING-TUNNELING-MICROSCOPY

被引：35

作者：

ALBREKTSEN, O

SALEMINK, HWM

MORCH, KA

THOLEN, AR

机构：

[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] TELE DANMARK RES,DK-2970 HORSHOLM,DENMARK

[3] TECH UNIV DENMARK,APPL PHYS LAB,DK-2800 LYNGBY,DENMARK

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 06期

关键词：

D O I：

10.1116/1.587497

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3187 / 3190

页数：4

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