In-Situ XPS Measurement of Co Nanoparticles Fabricated by Gas Evaporation Method

被引：1

作者：

Mizutani, Tsuyoshi ^{[1
]}

Ogawa, Satoshi ^{[1
]}

Tsukada, Chie ^{[1
]}

Nakanishi, Koji ^{[2
]}

Ohta, Toshiaki ^{[2
]}

Yagi, Shinya ^{[1
]}

机构：

[1] Nagoya Univ, Grad Sch Engn, Dept Quantum Engn, Chikusa Ku, Furo Cho, Nagoya, Aichi 4648603, Japan

[2] Ritsumeikan Univ, SR Ctr, Shiga 5258577, Japan

来源：

E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY | 2012年 / 10卷

关键词：

X-ray photoelectron spectroscopy; Cobalt; Nitrides; nanoparticles;

D O I：

10.1380/ejssnt.2012.351

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The cobalt and cobalt nitride nanoparticles (NPs) have been fabricated by gas evaporation method under helium or nitrogen gases environment. These chemical states and compositions have been investigated by in-situ XPS and those distributions have been estimated by AFM. It is found that both cobalt and cobalt nitride NPs are slightly oxidized by the residual gas in the chamber. The cobalt nitride NPs fabricated under nitrogen gas are including the nitrogen atoms at 4.7% and the nitrogen atoms have the chemical bonding with the cobalt atoms.

引用

页码：351 / 354

页数：4

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