ATTENUATED TOTAL REFLECTANCE AS A QUANTUM INTERFERENCE PHENOMENON

被引：31

作者：

HERMINGHAUS, S ^{[1
]}

KLOPFLEISCH, M ^{[1
]}

SCHMIDT, HJ ^{[1
]}

机构：

[1] TECH UNIV ILMENAU,FAK MATH & NATURWISSENSCH,D-98693 ILMENAU,GERMANY

来源：

OPTICS LETTERS | 1994年 / 19卷 / 04期

关键词：

D O I：

10.1364/OL.19.000293

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The fundamental mechanism of attenuated total-reflectance spectroscopy is elucidated. The characteristic minimum in the reflected intensity is interpreted as being a result of the interference between two events indistinguishable to the detector: the incoming photon either is totally reflected or is virtually converted into a surface-mode quantum. A simple universal resonance formula is derived that accounts satisfactorily for both the amplitude and the phase of the reflected light.

引用

页码：293 / 295

页数：3

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