ATTENUATED TOTAL REFLECTANCE AS A QUANTUM INTERFERENCE PHENOMENON

被引：30
作者：
HERMINGHAUS, S [1 ]
KLOPFLEISCH, M [1 ]
SCHMIDT, HJ [1 ]
机构：
[1] TECH UNIV ILMENAU,FAK MATH & NATURWISSENSCH,D-98693 ILMENAU,GERMANY
来源：
OPTICS LETTERS | 1994年 / 19卷 / 04期
关键词：
D O I：
10.1364/OL.19.000293
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The fundamental mechanism of attenuated total-reflectance spectroscopy is elucidated. The characteristic minimum in the reflected intensity is interpreted as being a result of the interference between two events indistinguishable to the detector: the incoming photon either is totally reflected or is virtually converted into a surface-mode quantum. A simple universal resonance formula is derived that accounts satisfactorily for both the amplitude and the phase of the reflected light.
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页码：293 / 295
页数：3
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