CORRECTED VALUES OF TUNGSTEN K-SERIES X-RAY WAVELENGTHS WITH THE 2-METER CURVED CRYSTAL DIFFRACTION SPECTROMETER

被引：0
作者：
SNELGROVE, P
ELHUSSAINI, J
DUMOND, JWM
机构：
来源：
PHYSICAL REVIEW | 1954年 / 95卷 / 05期
关键词：
D O I：
10.1103/PhysRev.95.1203
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1203 / 1204
页数：2
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