COMPUTER TECHNIQUES IN ANALYSIS OF FIELD-ION MICROGRAPHS

被引：9
作者：
YOULE, A
TAYLOR, DM
SCHWARTZ, DM
DAVIES, DM
DURY, BL
RALPH, B
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1972年 / 95卷 / APR期
关键词：
D O I：
10.1111/j.1365-2818.1972.tb03730.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：309 / &
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