ENERGY-DISPERSIVE X-RAY SPECTROSCOPY

[1] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY [J]. SCIENCE, 1966, 151 (3710) : 562 - &

[2] CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS [J]. ANALYTICAL CHEMISTRY, 1968, 40 (07) : 1080 - &

[3] HIGH-RESOLUTION X-RAY AND ELECTRON SPECTROMETER [J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 41 (01): : 161 - +

[4] GIAQUE RD, 1968, ANAL CHEM, V40, P2075

[5] GOULDING FS, 1969, UCRL18698 REP

[6] RADIOISOTOPE X-RAY SPECTROMETRY - A REVIEW [J]. ANALYST, 1966, 91 (1088) : 683 - &

[1] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY [J]. SCIENCE, 1966, 151 (3710) : 562 - &

[2] CALCULATION METHODS FOR FLUORESCENT X-RAY SPECTROMETRY - EMPIRICAL COEFFICIENTS VS FUNDAMENTAL PARAMETERS [J]. ANALYTICAL CHEMISTRY, 1968, 40 (07) : 1080 - &

[3] HIGH-RESOLUTION X-RAY AND ELECTRON SPECTROMETER [J]. NUCLEAR INSTRUMENTS & METHODS, 1966, 41 (01): : 161 - +

[4] GIAQUE RD, 1968, ANAL CHEM, V40, P2075

[5] GOULDING FS, 1969, UCRL18698 REP

[6] RADIOISOTOPE X-RAY SPECTROMETRY - A REVIEW [J]. ANALYST, 1966, 91 (1088) : 683 - &