APPLICATION OF THE IMAGING PLATE TO TEM OBSERVATION

The Imaging Plate was applied to TEM observation of silver bromide microcrystals as one of the electron-sensitive materials and a cross section of a charge-coupled device as a typical example which gives a high-contrast image. The high-sensitive Imaging Plate allowed us to record a high-magnification image of the silver bromide microcrystal at room temperature with very little irradiation damage by reducing electron dose to the specimen. The Imaging Plate also enabled recording of both shadow region and highlight region of the TEM image of the cross section of the charge-coupled device of which the electron intensity range was more than 2 orders of magnitude due to the wide dynamic range. The advantages of the imaging plate over the photographic film are also discussed.