MULTIPLE BEAM HOLOGRAPHIC-INTERFEROMETRY

被引:1
作者
SHAALAN, MS [1 ]
JONATHAN, JM [1 ]
机构
[1] UNIV PARIS 06, INST OPT, M FRANCON LAB, F-75230 PARIS 05, FRANCE
来源
OPTICA ACTA | 1978年 / 25卷 / 11期
关键词
D O I
10.1080/713819714
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:1025 / 1034
页数:10
相关论文
共 10 条
[1]   ON FACTORS CONTRIBUTING TO FORMATION OF MULTIPLE-BEAM FIZEAU FRINGES [J].
BARAKAT, N ;
MOKHTAR, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (02) :300-&
[2]   INTERFEROMETRY WITH A HOLOGRAPHICALLY RECONSTRUCTED COMPARISON BEAM - (E) [J].
BROOKS, RE ;
HEFLINGER, LO ;
WUERKER, RF .
APPLIED PHYSICS LETTERS, 1965, 7 (09) :248-+
[3]  
BROSSEL J, 1947, P PHYS SOC LOND, V59, P226
[4]  
BURCH JM, 1966, 50TH ANN M OPT SOC A
[5]  
FRANCON M, 1970, HOLOGRAPHIE
[6]  
Holden, 1949, P PHYS SOC LOND B, V62, P405, DOI 10.1088/0370-1301/62/7/301
[7]   2-BEAM INTERFEROMETRY BY SUCCESSIVE RECORDING OF INTENSITIES IN A SINGLE HOLOGRAM - (IMAGE SYNTHESIS COMPLEX ADDITION OF WAVE FRONTS T/E) [J].
STROKE, GW ;
LABEYRIE, AE .
APPLIED PHYSICS LETTERS, 1966, 8 (02) :42-+
[8]   MULTIPLE-BEAM INTERFEROMETRY APPLIED TO OSCILLATING SYSTEMS [J].
TOLANSKY, S .
APPLIED OPTICS, 1965, 4 (06) :727-&
[9]  
TOLANSKY S, 1960, SURFACE MICROTOPOGRA
[10]  
Tolansky S., 1949, MULTIPLE BEAM INTERF