THE STEP ROUGHENING TRANSITION OF A CU(113) SURFACE STUDIED BY SURFACE X-RAY-SCATTERING

被引:0
|
作者
LIANG, KS
SIROTA, EB
DAMICO, KL
HUGHES, GJ
SINHA, SK
机构
关键词
D O I
10.1116/1.575144
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:654 / 655
页数:2
相关论文
共 50 条
  • [31] Step and surface roughening - An introduction
    Chernov, AA
    THEORETICAL AND TECHNOLOGICAL ASPECTS OF CRYSTAL GROWTH, 1998, 276-2 : 57 - 69
  • [32] LONG-RANGE ORDER NEAR THE CU3AU(001) SURFACE BY EVANESCENT X-RAY-SCATTERING
    DOSCH, H
    MAILANDER, L
    REICHERT, H
    PEISL, J
    JOHNSON, RL
    PHYSICAL REVIEW B, 1991, 43 (16) : 13172 - 13186
  • [33] KINETICS OF RELAXATION AND UNMIXING IN POLYMER BLENDS AS STUDIED BY X-RAY-SCATTERING
    STROBL, G
    MAKROMOLEKULARE CHEMIE-MACROMOLECULAR SYMPOSIA, 1989, 26 : 413 - 429
  • [34] STRUCTURE AT THE YB/GAAS INTERFACE STUDIED BY ANOMALOUS X-RAY-SCATTERING
    AKIMOTO, K
    HIROSE, K
    MIZUKI, J
    PHYSICAL REVIEW B, 1991, 44 (04): : 1622 - 1627
  • [35] THE STRUCTURE OF AMORPHOUS PLATINUM DISULFIDE AS STUDIED BY ANOMALOUS X-RAY-SCATTERING
    SAITO, M
    WAKESHIMA, M
    SATO, N
    FUJINO, T
    WASEDA, Y
    MATSUBARA, E
    JACOB, KT
    ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1994, 49 (11): : 1031 - 1036
  • [36] COMBINED (1X2)-](1X1) TRANSITION AND ATOMIC ROUGHENING OF GE(001) STUDIED WITH SURFACE X-RAY-DIFFRACTION
    JOHNSON, AD
    NORRIS, C
    FRENKEN, JWM
    DERBYSHIRE, HS
    MACDONALD, JE
    VANSILFHOUT, RG
    VANDERVEEN, JF
    PHYSICAL REVIEW B, 1991, 44 (03): : 1134 - 1138
  • [37] PHASES OF PHOSPHATIDYL ETHANOLAMINE MONOLAYERS STUDIED BY SYNCHROTRON X-RAY-SCATTERING
    HELM, CA
    TIPPMANNKRAYER, P
    MOHWALD, H
    ALSNIELSEN, J
    KJAER, K
    BIOPHYSICAL JOURNAL, 1991, 60 (06) : 1457 - 1476
  • [38] STRUCTURE OF THE DOUBLE-LAYER AT AG(111) AS MEASURED WITH SURFACE X-RAY-SCATTERING
    TONEY, MF
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1993, 206 : 8 - PHYS
  • [39] SYNCHROTRON X-RAY-SCATTERING OF MELTING IN SURFACE-LAYERS AND THIN-FILMS
    MONCTON, DE
    JOURNAL OF METALS, 1982, 35 (12): : A46 - A46
  • [40] ASSESSMENT OF SURFACE-ROUGHNESS BY X-RAY-SCATTERING AND DIFFERENTIAL INTERFERENCE CONTRAST MICROSCOPY
    DEKORTE, PAJ
    LAINE, R
    APPLIED OPTICS, 1979, 18 (02): : 236 - 242