RAPID METHOD OF OBSIDIAN CHARACTERIZATION BY INELASTIC-SCATTERING OF PROTONS

被引：19

作者：

COOTE, GE ^{[1
]}

WHITEHEA.NE ^{[1
]}

MCCALLUM, GJ ^{[1
]}

机构：

[1] INST NUCL SCI,DEPT SCI & IND RES,LOWER HUTT,NEW ZEALAND

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1972年 / 12卷 / 02期

关键词：

D O I：

10.1007/BF02515342

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：491 / 496

页数：6

共 11 条

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[8] APPLICATION OF INELASTIC PROTON SCATTERING TO RAPID DETERMINATION OF SILICON IN STEELS [J].

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[9] MICROANALYSIS OF SURFACES BY SCANNING WITH CHARGED PARTICLE BEAMS [J].

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