OPTICALLY MONITORED ELECTRODEPOSITION OF THIN CDSE FILMS

被引：2
作者：
FRACASTORODECKER, M
FERREIRA, JLS
GOMES, NV
DECKER, F
机构：
来源：
THIN SOLID FILMS | 1987年 / 147卷 / 03期
关键词：
D O I：
10.1016/0040-6090(87)90025-3
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：291 / 297
页数：7
相关论文
共 12 条
[1]   SIMULTANEOUS DETERMINATION OF OPTICAL INDEXES OF AN ABSORBENT FILM AND ITS METALLIC SUBSTRATE BY STATISTICAL-ANALYSIS OF SPECTRO-REFLECTOMETRIC DATA - APPLICATION TO OXIDE-TITANIUM SYSTEM [J].
BLONDEAU, G ;
FROELICHER, M ;
FROMENT, M ;
HUGOTLEGOFF, A .
THIN SOLID FILMS, 1976, 38 (03) :261-270
[2]   THIN-FILM CDSE ELECTRODEPOSITED FROM SELENOSULFITE SOLUTION [J].
COCIVERA, M ;
DARKOWSKI, A ;
LOVE, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (11) :2514-2517
[3]   ELECTROCHEMICAL GROWTH, INSITU OPTICAL CHARACTERIZATION AND PHOTOELECTROCHEMICAL BEHAVIOR OF DITHIO-OXAMIDO COPPER(II) FILMS [J].
DECKER, F ;
FRACASTORODECKER, M ;
ZOTTI, G ;
MENGOLI, G .
ELECTROCHIMICA ACTA, 1985, 30 (09) :1147-1153
[4]  
DECKER F, 1985, UNPUB
[5]   ELECTROPLATED CADMIUM CHALCOGENIDE LAYERS - CHARACTERIZATION AND USE IN PHOTO-ELECTROCHEMICAL SOLAR-CELLS [J].
HODES, G ;
MANASSEN, J ;
NEAGU, S ;
CAHEN, D ;
MIROVSKY, Y .
THIN SOLID FILMS, 1982, 90 (04) :433-438
[6]   INSTABILITY OF ANODIC OXIDE-FILMS ON TITANIUM [J].
MCALEER, JF ;
PETER, LM .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (06) :1252-1260
[7]   DIFFERENTIAL REFLECTION SPECTROSCOPY OF VERY THIN SURFACE FILMS [J].
MCINTYRE, JD ;
ASPNES, DE .
SURFACE SCIENCE, 1971, 24 (02) :417-&
[8]   PHOTOCURRENT SPECTROSCOPY OF LEAD DIOXIDE [J].
PETER, LM .
SURFACE SCIENCE, 1980, 101 (1-3) :162-172
[9]   ELECTRODEPOSITION OF CDSE FILMS FROM SELENOSULFITE SOLUTION [J].
SKYLLAS-KAZACOS, M ;
MILLER, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (11) :2378-2381
[10]   A STUDY OF THE FORMATION OF ANODIC OXIDE FILMS ON URANIUM .1. AN OPTICAL REFLECTIVITY METHOD FOR DETERMINING THE KINETICS OF FILM GROWTH [J].
STEBBENS, AE ;
SHREIR, LL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (01) :30-36
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