IMAGING OF THE SILICON ON SAPPHIRE INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：39

作者：

PONCE, FA

ARANOVICH, J

机构：

来源：

APPLIED PHYSICS LETTERS | 1981年 / 38卷 / 06期

关键词：

D O I：

10.1063/1.92389

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：439 / 441

页数：3

共 16 条

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[8] ELECTRON-MICROSCOPE STUDY OF MICROTWINS IN EPITAXIAL SILICON FILMS ON SAPPHIRE [J].

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[9]

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[10]

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