INTERFACE AND SURFACE-STRUCTURE OF EPITAXIAL NISI2 FILMS

被引：63
作者：
CHIU, KCR
POATE, JM
ROWE, JE
SHENG, TT
CULLIS, AG
机构：
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
[2] ROYAL SIGNALS & RADAR ESTAB,GREAT MALVERN WR14 3PS,WORCESTERSHIRE,ENGLAND
来源：
APPLIED PHYSICS LETTERS | 1981年 / 38卷 / 12期
关键词：
D O I：
10.1063/1.92222
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：988 / 990
页数：3
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HENZLER M, 1977, ELECTRON SPECTROSCOP
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ISHIWARA H, 1980, THIN FILM INTERFACES
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PHILLIPS JC, 1976, PHYS SEMICOND, P12
[5]   ADVANCES IN TRANSMISSION ELECTRON-MICROSCOPE TECHNIQUES APPLIED TO DEVICE FAILURE ANALYSIS [J].
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) :737-743
[6]  
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