ON THE USE OF THIMBLE CHAMBERS IN PHANTOMS

被引：19

作者：

ADAMS, GD

机构：

来源：

关键词：

D O I：

10.1148/78.1.77

中图分类号：

R8 [特种医学]; R445 [影像诊断学];

学科分类号：

1002 ; 100207 ; 1009 ;

摘要：

引用

页码：77 / 90

页数：14

共 32 条

[1] ON MEASURING EXPOSURE DOSE IN PHANTOMS WITH THIMBLE CHAMBERS [J].

ADAMS, GD .

[2]

ADAMS GD, 1955, RADIAT RES, V3, P210

[3]

COHEN M, 1960, COMMUNICATION

[4]

COHEN M, 1960, HPA B, V7, P23

CORMACK, DV ;

GRIFFITH, TJ ;

JOHNS, HE .

[6] SPECTRAL DISTRIBUTIONS OF 280 KVP X-RAYS [J].

CORMACK, DV ;

DAVITT, WE ;

BURKE, DG ;

RAWSON, EG .

[7]

DUNLAP WC, 1959, METHODS EXPT PHYSI B, V6

[8]

FAILLA G, 1939, RADIOLOGY, V29, P202

[9] X-RAY INDUCED CONDUCTIVITY IN INSULATING MATERIALS [J].

FOWLER, JF .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1956, 236 (1207) :464-480

[10]

Fricke H, 1925, AM J ROENTGENOL RADI, V13, P462