THE APPLICATION OF CONVERGENT-BEAM ELECTRON-DIFFRACTION TO THE DETECTION OF SMALL SYMMETRY CHANGES ACCOMPANYING PHASE-TRANSFORMATIONS .1. GENERAL AND METHODS

被引:71
作者
ECOB, RC
SHAW, MP
PORTER, AJ
RALPH, B
机构
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1981年 / 44卷 / 05期
关键词
D O I
10.1080/01418618108235798
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1117 / 1133
页数:17
相关论文
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