VARIATION OF YIELD WITH THICKNESS IN SIMS AND PDMS - MEASUREMENTS OF SECONDARY ION EMISSION FROM ORGANIZED MOLECULAR FILMS

被引：46

作者：

BOLBACH, G ^{[1
]}

BEAVIS, R ^{[1
]}

DELLANEGRA, S ^{[1
]}

DEPRUN, C ^{[1
]}

ENS, W ^{[1
]}

LEBEYEC, Y ^{[1
]}

MAIN, DE ^{[1
]}

SCHUELER, B ^{[1
]}

STANDING, KG ^{[1
]}

机构：

[1] INST CURIE,PHYS & CHIM BIOMOLEC LAB,PHYS & CHIM SECT,F-75231 PARIS 05,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 30卷 / 01期

关键词：

D O I：

10.1016/0168-583X(88)90082-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：74 / 82

页数：9

共 53 条

[1]

Andersen H. H., 1981, Sputtering by particle bombardment I. Physical sputtering of single-element solids, P145

[2] REACTIVITY OF ORGANIC-MOLECULES IN MONOLAYERS [J].

BARRAUD, A ;

ROSILIO, C ;

RUAUDELTEIXIER, A .

THIN SOLID FILMS, 1980, 68 (01) :7-12

[3]

Behrisch R., 1981, Sputtering by Particle Bombardment, V1

[4] SOME ASPECTS OF SECONDARY ION MASS-SPECTROMETRY OF ORGANIC-COMPOUNDS [J].

BENNINGHOVEN, A .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 53 (SEP) :85-99

[5]

BENNINGHOVEN A, 1983, SPRINGER SERIES CHEM, V25, P64

[6]

BIERSACK JP, 1982, SPRINGER SERIES ELEC, V10, P157

[7]

BOLBACH G, 1985, 33RD AM SOC MASS SPE

[8]

BOLBACH G, 1987, RAP COMM MASS SPECTR, V1, P22

[9] A TIME-OF-FLIGHT MASS-SPECTROMETER FOR MEASUREMENT OF SECONDARY ION MASS-SPECTRA [J].

CHAIT, BT ;

STANDING, KG .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 40 (02) :185-193

[10]

COLTON RJ, 1977, 25TH AM SOC MASS SPE

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