CURRENT CONFINEMENT AND LEAKAGE CURRENTS IN PLANAR BURIED-RIDGE-STRUCTURE LASER-DIODES ON N-SUBSTRATE

被引：22
作者：
AMANN, MC
THULKE, W
机构：
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 07期
关键词：
D O I：
10.1109/3.29300
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：1595 / 1602
页数：8
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