ANALYSIS OF THE ELECTRICAL-RESISTIVITY OF DOUBLE-LAYER METAL-FILM

Assuming that the various sources of scattering act independently in metal films and introducing the mean-free path describing the Fuchs-Sondheimer effect and the grain-boundary scattering, an apparent size effect is defined for a double-layer metal film; a similar method is used for representing any source of scattering with reference to the base layer. General expressions for the electrical conductivity of a double-layer metal film are thus obtained. Qualitative agreement with previous results of other authors is found in the thickness range where these early expressions are valid.