APPLICATION OF SEMICONDUCTOR SPECTROMETERS FOR ELEMENTAL ANALYSIS IN ELECTRON-MICROSCOPY

被引：0
作者：
KHODAN, AN [1 ]
机构：
[1] ACAD SCI USSR,INST PHYS CHEM,MOSCOW V-71,USSR
来源：
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA | 1977年 / 41卷 / 05期
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：1052 / 1054
页数：3
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