RELIABILITY OF CMOS INTEGRATED-CIRCUITS

被引：11

作者：

SCHNABLE, GL

GALLACE, LJ

PUJOL, HL

机构：

[1] RCA, DIV SOLID STATE, RELIABIL ENGN LAB, PRINCETON, NJ 08540 USA

[2] RCA, DIV SOLID STATE, W PALM BEACH, FL USA

来源：

COMPUTER | 1978年 / 11卷 / 10期

关键词：

D O I：

10.1109/C-M.1978.217937

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：6 / 17

页数：12

共 50 条

[41] PROCESS OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DERBENWICK, GF
GREGORY, BL
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2151 - 2156
[42] TIMING SIMULATION OF DIGITAL CMOS INTEGRATED-CIRCUITS USING ELSIM
MALOWANY, ME
MALOWANY, AS
PROCEEDINGS OF THE 1989 SUMMER COMPUTER SIMULATION CONFERENCE, 1989, : 145 - 150
[43] ELECTRICALLY ACTIVE STACKING-FAULTS IN CMOS INTEGRATED-CIRCUITS
DISHMAN, JM
HASZKO, SE
MARCUS, RB
MURARKA, SP
SHENG, TT
JOURNAL OF APPLIED PHYSICS, 1979, 50 (04) : 2689 - 2696
[44] RELIABILITY OF INTEGRATED-CIRCUITS AND SYSTEMS FROM A MANUFACTURING POINT OF VIEW
KING, GR
RADIO AND ELECTRONIC ENGINEER, 1978, 48 (7-8): : 349 - 354
[45] RELIABILITY REPORT ON LOW-POWER TTL INTEGRATED-CIRCUITS
ADAMS, JD
GIANELLE, WH
MICROELECTRONICS AND RELIABILITY, 1972, 11 (02): : 171 - &
[46] RELIABILITY OF PLASTIC ENCAPSULATED SEMICONDUCTOR-DEVICES AND INTEGRATED-CIRCUITS
REICH, B
SOLID STATE TECHNOLOGY, 1978, 21 (09) : 82 - 88
[47] RELIABILITY OF PLASTIC-ENCAPSULATED INTEGRATED-CIRCUITS IN MOISTURE ENVIRONMENTS
GALLACE, L
ROSENFIELD, M
RCA REVIEW, 1984, 45 (02): : 249 - 277
[48] ELECTROMIGRATION-INDUCED FAILURE AND RELIABILITY OF METALLIZATIONS IN INTEGRATED-CIRCUITS
ITSKOVICH, IF
SORBELLO, RS
JOURNAL OF APPLIED PHYSICS, 1993, 74 (02) : 983 - 987
[49] RELIABILITY IMPROVEMENT OF BIPOLAR INTEGRATED-CIRCUITS THROUGH A CONTAMINATION REDUCTION
RIMAUR, A
CASTILLO, C
DUCASSE, JP
PAGES, I
JOURNAL OF ENVIRONMENTAL SCIENCES, 1985, 28 (02): : 38 - 38
[50] EARLY-LIFE RELIABILITY PREDICTION METHODOLOGY FOR INTEGRATED-CIRCUITS
MENON, SS
POOLE, KF
MICROELECTRONICS AND RELIABILITY, 1995, 35 (08): : 1147 - 1155

← 1 2 3 4 5 →