RELIABILITY OF CMOS INTEGRATED-CIRCUITS

被引：11

作者：

SCHNABLE, GL

GALLACE, LJ

PUJOL, HL

机构：

[1] RCA, DIV SOLID STATE, RELIABIL ENGN LAB, PRINCETON, NJ 08540 USA

[2] RCA, DIV SOLID STATE, W PALM BEACH, FL USA

来源：

COMPUTER | 1978年 / 11卷 / 10期

关键词：

D O I：

10.1109/C-M.1978.217937

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：6 / 17

页数：12

共 50 条

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