AVAILABILITY ANALYSIS OF A 2 UNIT REPAIRABLE PARALLEL REDUNDANT SYSTEM WITH COMMON-MODE FAILURES AND ARBITRARILY DISTRIBUTED DOWN TIMES

被引：2
作者：
DICHIRICO, C
SINGH, C
机构：
[1] TEXAS A&M UNIV,DEPT ELECT ENGN,COLLEGE STN,TX 77843
[2] UNIV BARI,DIPARTIMENTO ELETTROTECN & ELETTR,I-70124 BARI,ITALY
来源：
MICROELECTRONICS AND RELIABILITY | 1986年 / 26卷 / 06期
关键词：
D O I：
10.1016/0026-2714(86)90822-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1183 / 1188
页数：6
相关论文
共 6 条
[1]  
Baker C., 1977, NUMERICAL TREATMENT, P352
[2]  
Cox D.R., 1955, P CAMB PHILOS SOC, V51, P433, DOI DOI 10.1017/S0305004100030437
[3]  
Gaver D., 1963, IEEE T RELIAB, VR-12, DOI [10.1109/TR.1963.5218202, DOI 10.1109/TR.1963.5218202]
[4]   STOCHASTIC-BEHAVIOR OF A 2-UNIT PARALLELED SYSTEM [J].
OHASHI, M ;
HUANG, JM ;
NISHIDA, T .
MICROELECTRONICS AND RELIABILITY, 1980, 20 (04) :471-476
[5]  
TAYLOR JR, 1975, IAEASM19516 REL NUC
[6]  
WRIGHT RI, 1985, NUCLEAR ENG, V26
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