A MESFET VARIABLE-CAPACITANCE MODEL FOR GAAS INTEGRATED-CIRCUIT SIMULATION

被引:82
作者
TAKADA, T
YOKOYAMA, K
IDA, M
SUDO, T
机构
关键词
D O I
10.1109/TMTT.1982.1131127
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:719 / 724
页数:6
相关论文
共 7 条
[2]  
GREY PE, 1963, PHYSICAL ELECTRONICS
[3]  
Pucel RA, 1975, ADV ELECTRONICS ELEC, V38, P195, DOI DOI 10.1016/S0065-2539(08)61205-6
[4]   ANALYTICAL MODEL OF GAAS MESFETS [J].
SHUR, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (06) :612-618
[5]   2-DIMENSIONAL NUMERICAL-ANALYSIS OF STABILITY-CRITERIA OF GAAS FETS [J].
YAMAGUCHI, K ;
ASAI, S ;
KODERA, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (12) :1283-1290
[6]   DRAIN CONDUCTANCE OF JUNCTION GATE FETS IN HOT-ELECTRON RANGE [J].
YAMAGUCHI, K ;
KODERA, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1976, 23 (06) :545-553
[7]  
YOKOYAMA K, UNPUB NONLINEAR CAPA