CHARACTERIZATION OF A DIRECT SAMPLE INSERTION DEVICE FOR INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY

被引：30

作者：

KARANASSIOS, V ^{[1
]}

HORLICK, G ^{[1
]}

ABDULLAH, M ^{[1
]}

机构：

[1] UNIV ALBERTA,DEPT CHEM,EDMONTON T6G 2G2,ALBERTA,CANADA

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1990年 / 45卷 / 1-2期

关键词：

D O I：

10.1016/0584-8547(90)80082-T

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

A direct sample insertion device allows insertion of sample carrying probes into an inductively coupled plasma discharge. In this study, analyte emission temporal behavior for such a device was surveyed for several elements with a range of vaporization properties. The emission time behavior for most elements was characterized as a function of probe geometry, composition, insertion speed and insertion position as well as applied plasma power. A long undercut graphite electrode was found to be the best shape for all probe geometries tested. Furthermore, it was demonstrated that the sample carrying probe should be inserted rapidly to a position corresponding to the top of the load coil and the plasma power should be high (1.75-2.00 kW) in order to attain best analytical performance. © 1990.

引用

页码：105 / 118

页数：14

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