RADIATION-INDUCED DEFECT CENTERS IN HIGH-PURITY GEO2 GLASS

被引：43

作者：

TSAI, TE

GRISCOM, DL

FRIEBELE, EJ

FLEMING, JW

机构：

[1] USN,RES LAB,DIV OPT SCI,WASHINGTON,DC 20375

[2] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 06期

关键词：

D O I：

10.1063/1.339481

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2264 / 2268

页数：5

共 21 条

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