ELECTRON-MICROSCOPY IN MATERIALS SCIENCE

被引：0

|

作者：

MITCHELL, TE ^{[1
]}

机构：

[1] CASE WESTERN RESERVE UNIV,CLEVELAND,OH 44106

来源：

AMERICAN CERAMIC SOCIETY BULLETIN | 1981年 / 60卷 / 08期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：857 / 857

页数：1

相关论文

共 50 条

[21] ELECTRON-MICROSCOPY IN MATERIALS SCIENCE RECENT PROGRESS AND FUTURE-DEVELOPMENTS
HIRSCH, PB
JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 : S25 - S32
[22] SCANNING ELECTRON-MICROSCOPY IN FORENSIC SCIENCE
TAYLOR, ME
JOURNAL OF THE FORENSIC SCIENCE SOCIETY, 1973, 13 (04): : 269 - 280
[23] IS ELECTRON-MICROSCOPY A PURELY MORPHOLOGICAL SCIENCE
BERNHARD, W
BIOMEDICINE, 1977, 26 (04): : 266 - 267
[24] TRANSMISSION ELECTRON-MICROSCOPY IN EARTH SCIENCE
CHAMPNESS, PE
ANNUAL REVIEW OF EARTH AND PLANETARY SCIENCES, 1977, 5 : 203 - 226
[25] SCANNING ELECTRON-MICROSCOPY IN MEAT SCIENCE
VOYLE, CA
SCANNING ELECTRON MICROSCOPY, 1981, : 405 - 413
[26] PREPARATION OF CERAMIC MATERIALS FOR ELECTRON-MICROSCOPY
LEPISTO, TK
ULTRAMICROSCOPY, 1988, 24 (01) : 72 - 72
[27] ANALYTICAL ELECTRON-MICROSCOPY OF ELECTRONIC MATERIALS
LORETTO, MH
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1987, (87): : 633 - 642
[28] ANALYTICAL ELECTRON-MICROSCOPY OF ADVANCED MATERIALS
LORETTO, MH
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 107 (02): : 673 - 680
[29] CHARACTERIZATION OF SEMICONDUCTING MATERIALS BY ELECTRON-MICROSCOPY
CAMANZI, A
ULTRAMICROSCOPY, 1984, 12 (1-2) : 98 - 98
[30] UP CLOSE - CENTER FOR ELECTRON-MICROSCOPY OF MATERIALS SCIENCE AT THE UNIVERSITY-OF-ANTWERP
VANTENDELOO, G
SCHRYVERS, D
VANDYCK, D
VANLANDUYT, J
AMELINCKX, S
MRS BULLETIN, 1994, 19 (09) : 57 - 59

← 1 2 3 4 5 →