HIGH-RESOLUTION ELECTRON-MICROSCOPY OF STRUCTURAL DEFECTS IN CRYSTALLINE C-60 AND C-70

被引：32
作者：
MUTO, S
VANTENDELOO, G
AMELINCKX, S
机构：
[1] EM AT, University of Antwerp, Antwerp, B-2020
[2] Department of Physics, College of General Education, Osaka University, Toyonaka, Osaka
来源：
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1993年 / 67卷 / 04期
关键词：
D O I：
10.1080/13642819308207685
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The room-temperature form of C60 and C70 crystals is studied by means of high-resolution electron microscopy. Some contrast effects on high-resolution images, specific to the materials consisting of molecules with a spherical shell shape, are presented. The observed defect configurations are very similar to those of f.c.c. metals and alloys with a low stacking-fault energy. Lattice relaxation at twin interfaces, surfaces and stacking faults as well as surface reconstruction are also discussed.
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页码：443 / 463
页数：21
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