SINGLE EVENT UPSET RATES IN SPACE

被引：35

作者：

CAMPBELL, A

MCDONALD, P

RAY, K

机构：

[1] SFA INC,LANDOVER,MD

[2] PHILLIPS LAB,BEDFORD,MA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1992年 / 39卷 / 06期

关键词：

D O I：

10.1109/23.211373

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

SEUs in the CRRES MEP showed a dramatic increase during a solar flare, the influence of the flare varied widely among device types, and a GaAs RAM showed a different response to the proton belts than some Si RAMs. Corrections to the SEU rate to account for orbital dwell time emphasize the dramatic difference between the rate in the proton belts and the rate due to cosmic ray ions above the belts. In the case of one device, apparent total dose damage resulted in a large increase in upsets due to unreliable device operation.

引用

收藏

页码：1828 / 1835

页数：8

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