NANOSTRUCTURE FABRICATION IN INP AND RELATED-COMPOUNDS

被引:39
作者
ADESIDA, I
NUMMILA, K
ANDIDEH, E
HUGHES, J
CANEAU, C
BHAT, R
HOLMSTROM, R
机构
[1] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801
[2] BELL COMMUN RES INC,RED BANK,NJ 07701
[3] GTE LABS INC,WALTHAM,MA 02254
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1990年 / 8卷 / 06期
关键词
D O I
10.1116/1.585077
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanometer-scale gratings have been fabricated in InP and InGaAs/InP heterostructures using electron-beam lithography and reactive-ion etching in methane-hydrogen plasmas. It is shown that the slight overcut obtained in the etch profiles during a single-step etch in CH4/H-2 is due to polymer formation on inert mask surfaces and edges. Intermittent removal of the deposited polymer film is shown to be effective in obtaining anisotropic profiles. Highly anisotropic 35-nm-wide InP lines at 70-nm pitch demonstrate the potential of this fabrication process. The formation of 100-nm-wide free-standing InP wires is also presented.
引用
收藏
页码:1357 / 1360
页数:4
相关论文
共 22 条
  • [1] ADESIDA I, 1989, I PHYS C SER, V96, P425
  • [2] SHORT-PERIOD GRATINGS FOR LONG-WAVELENGTH OPTICAL-DEVICES
    ANDIDEH, E
    ADESIDA, I
    BROCK, T
    CANEAU, C
    KERAMIDAS, V
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (06): : 1841 - 1845
  • [3] ANDIDEH E, 1990, THESIS U ILLINOIS
  • [4] REACTIVE ION ETCHING OF GAAS USING A MIXTURE OF METHANE AND HYDROGEN
    CHEUNG, R
    THOMS, S
    BEAMONT, SP
    DOUGHTY, G
    LAW, V
    WILKINSON, CDW
    [J]. ELECTRONICS LETTERS, 1987, 23 (16) : 857 - 859
  • [5] NOVEL INTERFERENCE EFFECTS BETWEEN PARALLEL QUANTUM WELLS
    DATTA, S
    MELLOCH, MR
    BANDYOPADHYAY, S
    NOREN, R
    VAZIRI, M
    MILLER, M
    REIFENBERGER, R
    [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (21) : 2344 - 2347
  • [6] Furuya K., 1988, Transactions of the Institute of Electronics, Information and Communication Engineers E, VE71, P286
  • [7] Hasko D. G., 1989, Microelectronic Engineering, V9, P337, DOI 10.1016/0167-9317(89)90073-7
  • [8] REACTIVE ION ETCHING OF INP USING CH4/H2 MIXTURES - MECHANISMS OF ETCHING AND ANISOTROPY
    HAYES, TR
    DREISBACH, MA
    THOMAS, PM
    DAUTREMONTSMITH, WC
    HEIMBROOK, LA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (05): : 1130 - 1140
  • [9] EPITAXIAL-GROWTH ON INP SUBSTRATES ETCHED WITH METHANE REACTIVE ION ETCHING TECHNIQUE
    HENRY, L
    VAUDRY, C
    LECORRE, A
    LECROSNIER, D
    ALNOT, P
    OLIVIER, J
    [J]. ELECTRONICS LETTERS, 1989, 25 (18) : 1257 - 1259
  • [10] VERY FINE CORRUGATIONS FORMED ON INP BY WET CHEMICAL ETCHING AND ELECTRON-BEAM LITHOGRAPHY
    INAMURA, E
    TAMURA, S
    MIYAMOTO, Y
    FURUYA, K
    SUEMATSU, Y
    [J]. ELECTRONICS LETTERS, 1989, 25 (03) : 238 - 240